@conference {489, title = {Electron beam induced current measurement on a specimen based in a cathode lens}, booktitle = {MC 2009 - Microscopy Conference: First Joint Meeting ofDreil{\"a}ndertagung and Multinational Conference on Microscopy}, series = {MC 2009 - Joint Meeting of Dreil{\"a}ndertagung and MultinationalCongress on Microscopy /9./}, year = {2009}, note = {Export Date: 23 January 2010Source: ARL-ASEP}, month = {2009}, publisher = {Verlag der Technischen Universit{\"a}t}, organization = {Verlag der Technischen Universit{\"a}t}, address = {Graz}, keywords = {cathode lens, elektron beam induced current, SEM, specimen bias, very low energy electrons}, isbn = {978-3-85125-062-6}, author = {Miroslav Hor{\'a}{\v c}ek and Martin Zoba{\v c} and Ivan Vl{\v c}ek} }