@conference {489,
	title = {Electron beam induced current measurement on a specimen based in a cathode lens},
	booktitle = {MC 2009 - Microscopy Conference: First Joint Meeting ofDreil{\"a}ndertagung and Multinational Conference on Microscopy},
	series = {MC 2009 - Joint Meeting of Dreil{\"a}ndertagung and MultinationalCongress on Microscopy /9./},
	year = {2009},
	note = {Export Date: 23 January 2010Source: ARL-ASEP},
	month = {2009},
	publisher = {Verlag der Technischen Universit{\"a}t},
	organization = {Verlag der Technischen Universit{\"a}t},
	address = {Graz},
	keywords = {cathode lens, elektron beam induced current, SEM, specimen bias, very low energy electrons},
	isbn = {978-3-85125-062-6},
	author = {Miroslav Hor{\'a}{\v c}ek and Martin Zoba{\v c} and Ivan Vl{\v c}ek}
}